AZX 400 Wavelength Dispersive X-Ray Fluorescence Spectrometer

The AZX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer from Rigaku is specifically designed for handling heavy or large samples. The system can accept samples up to 400mm diameter, 50mm thick and 30kg in weight and is suitable for analyzing sputtering targets, magnetic disks, multilayer film metrology or elemental analysis of large samples.

The AZX 400 can be adapted to a range of sample shapes and sizes using made to order, optional inserts. With a variable measurement spot (30mm to 0.5mm diameter with 5-step automatic selection) and mapping capability with multi-point measurements for checking sample uniformity, this innovative instrument can streamline quality control processes considerably. It has an optional real-time camera for enabling the analysis point to be seen on screen.

Key Features

The key features of the AZX 400 WDXRF spectrometer are:

  • Measurement spot -30mm to 0.5mm diameter and 5-step automatic selection
  • Mapping capability – Enables multipoint measurements
  • Sample view camera (option)
  • General purpose – Can analyze Be to U, has an elemental range of ppm to % and thickness range of sub Å to mm
  • Diffraction interference rejection (option) – Ensures accurate results for single-crystal substrates
  • Compliance with industry standards - SEMI, CE marking
  • Compact

Other Equipment by this Supplier

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.