Equipment | Physical Properties Testing |Semiconductor/Wafer Metrology Tools

Semiconductor/Wafer Metrology Tools

Within the semiconductor industry, there is a continual demand for integrated circuits (IC) that exhibit higher performance at a lower cost than its predecessors. Wafer metrology tools are used to design and manufacture ICs by carefully controlling the film properties, linewidths, and potential defect levels in order to optimize the manufacturing process of these devices. Metrology tools combined with wafer inspection capabilities are able to ensure that they target physical and electrical properties of semiconductor devices under production. Wafer metrology is able to specifically identify surface particles, pattern flaws, and other conditions that could cause adverse effects to the performance of these devices.

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