Posted in | Spectrometers

Searching for a reliable testing method of transparent conductive oxides?

Transparent conductive oxides (TCO) in thin-film solar cells, touch screens and flat-panel displays (FPD) can be measured by Spectroscopic Ellipsometry, which is an ultimate metrology technique to characterize their properties.

The Semilab SE-2000 is a combined ellipsometry metrology system with measurement capabilities from the mid-lR to the UV range, which can uniquely cover these wide wavelength ranges in one system. SE-2000 is used as an R&D and also as industrial scale metrology solution to determine layer thickness, as well as optical and electrical properties of TCO layers (e.g. conductivity, any bandwidth information) in a non-destructive way.

Explore Semilab’s cutting-edge metrologies and lab services: SE-2000 Spectroscopic Ellipsometry !

Spectroscopic Ellipsometry for Transparent Conductive Oxides Characterization

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