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Vimetco Awarded Two Prospecting Permits for Bauxite Mine

Stork Technimet Introduce New Finite Element Analysis (FEA) and Dynamic Mechanical Analysis (DMA) Service

Stork Technimet Introduce New Finite Element Analysis (FEA) and Dynamic Mechanical Analysis (DMA) Service

Thermo Fisher Release New Cost Effective Diffuse Reflectance Accessory for Material Science Tests

Thermo Fisher Release New Cost Effective Diffuse Reflectance Accessory for Material Science Tests

New Gaussian Beam Lithography System to Offer Universities Wide Range of Applications

New Gaussian Beam Lithography System to Offer Universities Wide Range of Applications

Study Demonstrates with Precision that Pipe Flow Turbulence Disappears with Time

Study Demonstrates with Precision that Pipe Flow Turbulence Disappears with Time

NIST Propose New, Economical Method for Light-Emitting Diode (LED) Manufacturing Standard

NIST Propose New, Economical Method for Light-Emitting Diode (LED) Manufacturing Standard

New Organic Light Emitting Diode (OLED) Market Analysis Report Available Now

IBM System Selected by EADS for 3D Design and Manufacturing to Help Reshape the Future of Aerospace and Defense Products

New Light on Nacre's Nanostructural Architecture Using Advanced Light Source (ALS)

New Light on Nacre's Nanostructural Architecture Using Advanced Light Source (ALS)

NIST Proves Existence of Key Magnetic Electronic Property of Specially Built Semiconductor Devices

NIST Proves Existence of Key Magnetic Electronic Property of Specially Built Semiconductor Devices

New "Barcode Chip" Promises to Revolutionize Diagnostic Medical Testing

New "Barcode Chip" Promises to Revolutionize Diagnostic Medical Testing

European Synchrotron Radiation Facility (ESRF) Undergoes Next Generation Upgrade

European Synchrotron Radiation Facility (ESRF) Undergoes Next Generation Upgrade

Scientists Overcomes a Decades-Old Obstacle to Understanding Magnetic Resonance

Scientists Overcomes a Decades-Old Obstacle to Understanding Magnetic Resonance

NIST Demonstrate Method for Measuring Stress/Strain Levels of Semiconductors at the Nanoscale

NIST Demonstrate Method for Measuring Stress/Strain Levels of Semiconductors at the Nanoscale

"Field Hospital on a Chip" to Provide Instant Treatment for Combat Wounds

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