The Role of Electron Microscopy in Battery Research Dr. Y. Shirley Meng In this interview, AZoM talks to Dr. Y. Shirley Meng, Professor of Materials Science at the University of San Diego, about battery research, and how electron microscopy plays a vital role within it.
Hybrid Pixel Technology Provides Data that You Can Rely On, An Indispensible Advancement for TEMs Yemliha Bilal Kalyoncu In this interview, AZoM talks to Yemliha Bilal Kalyoncu, Application Engineer at Amsterdam Scientific Instruments about how an indispensable advancement for TEMs is provided by hybrid pixel technology.
Characterization of Catalyst Nanoparticles Dr. Min Wu In this interview, AZoM talks to Dr, Min Wu, business development manager for Thermo Fisher Scientific, about the instrumentation used for the characterization of catalyst nanoparticles.
Ion Beam Cross Section Polisher (CP): IB-19530CPThe IB-19530CP Ion Beam Cross Section Polisher (CP) produces pristine cross sections of samples—hard, soft, or composites—without smearing, crumbling, distorting, or contaminating them in any way. From JEOL USA, Inc.
Qpol 250 BOT: Grinding and Polishing RobotThe compact grinding and polishing robot, Qpol 250 BOT, from QATM is fully integrated into the System Lab 2.0. From QATM GmbH
Emission and Process Monitoring with the ACF5000Discover the new emission and process monitoring equipment from ABB. The ACF5000 can help reduce emissions dramatically. From ABB Measurement & Analytics