The Carl Zeiss Sigma VP Scanning Electron Microscope (SEM)

John Treadgold from Carl Zeiss shows us the main features and specifications of the Sigma VP (Variable Pressure) scanning electron microscope (SEM). He covers its capabilities, including options for detectors etc and its ease of use and user interface as well as the ability to integrate the SEM with Carl Zeiss optical microscopes.

Run time - 5:42min

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