The EDAX Trident Analysis System integrates EDS, WDS and EBSD analytical techniques on a single platform and offers a complete materials characterization solution.
Flawless integration is ensured via complete data collection and sharing between these different techniques. Each method can be utilized separately, or the data can be combined to provide results that were not possible before.
The EDS analysis offers all the tools required from simple qualitative analysis to sophisticated quantitative calculations. Smart features ensure reliable analysis, data collection, and reporting. In addition, EXpert ID utilizes analytical intelligence to separate overlaps and reveal minor peaks.
The EBSD analysis integrates the accessibility of the software platform with the analytical power of Orientation Imaging Microscopy (OIM) to provide advanced crystal structure characterization to all users. Features such as Confidence Index (CI) and Patented ChI-Scan™ allow patented verification of indexing accuracy and enable superior multiphase analysis for enhanced indexing accuracy and phase, respectively.
WDS scans complement EDS spectrum collection to produce precise quantitative and qualitative analysis.
The main features of the Trident Analysis System are as follows:
- Integrates with Octane Elite Silicon Drift Detectors (SDDs), the platinum standard for EDS analysis
- Advanced electronics provide excellent efficiency and resolution across the entire range of count rates
- For EBSD, the available choices are the Velocity™, Hikari Super, and DigiView EBSD cameras. The Velocity™, powered by a CMOS sensor, offers high-speed EBSD mapping with the highest indexing performance on real-world materials. The Hikari Super provides the perfect mix of speed and sensitivity, while the DigiView is ideal for high-resolution analysis
- For WDS analysis, the Transition Element X-ray Spectrometer (TEXS) is available
- Provides both elemental and crystallographic results quickly and easily
- Allows users to focus their efforts on understanding their materials, rather than on collecting data