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Cutting transmission electron microscopy (TEM) discs from metals, alloys, and any ductile materials with a Disc Punch is the preferred approach.
USAGE OF PISTON RIM DESIGN: Overall compression and cutting forces are prevented from extending into the specimen’s central area by a unique piston-rim design
ChromaCL2TM iBSED Detector: Color Cathodoluminescence Imaging System
Disc Grinder to Pre-Thin and Polish Samples
EDAX EDS: Elite T Silicon Drift Detector
EELS and EFTEM Systems - GIF Continuum and Continuum S
Elsa Cryo-Transfer Holder
High Quality 16 Megapixel Stills and Videos for TEM Applications with the OneView Camera
K3 Cameras: Single-Electron Counting Direct Detection Cameras
K3 IS Camera for In-situ Microscopy
Liquid Helium and Liquid Nitrogen Cooling Stages
Low Energy Surface Preparation with the Ilion II System
OneView LD Camera for Transmission Electron Microscope (TEM) Measurements
Plasma Tool to Remove Hydrocarbon Contamination - Solarus II Plasma Cleaner
Polishing and Coating of SEM Samples using a PECS II Argon Beam System
Rapid and Reliable Pre-Thinning to Near Electron Transparency with the Dimple Grinder II
Reproducible and Precise Ion Polishing with the PIPS II System
SEM-Based Cathodoluminescence - Monarc CL Detector
Single and Double Tilt Heating Holders
Specimen Heating for SEM with the Murano Heating Stage
Stela Hybrid-Pixel Camera: Fully Integrated Hybrid-Pixel Electron Detector
STEMx System: 4D STEM Diffraction System
Transforming Electron Microscopy with CMOS Camera Rio