Lambda Wavelength Dispersive Spectrometry (WDS) Analysis System

EDAX’s Lambda™ Wavelength Dispersive Spectrometry (WDS) Analysis System integrates the WDS software with the most advanced spectrometers for enhanced precision and accuracy, thus ensuring the best results for users’ materials analysis.

The Lambda spectrometers have been developed for parallel beam operation and come in different models:

  • Lambda Plus—Offers the optimum efficiency for transition element energies ranging from 150 eV to 10 keV (B Kα to Ge Kα) by using polycapillary optics.
  • Lambda Super—This dual optics system offers the most optimal efficacy for light elements, particularly B, C, N and O with its high-collection, reflective and patent-pending X-ray optics. When this model is used along with the polycapillary optics, the high intensity can be extended up to 16 keV, for a complete range of operation varying from 100 eV to 16 keV.

Thanks to the compact design of the Lambda spectrometers, they can be installed easily on any standard Energy Dispersive Spectroscopy (EDS) port. The Lambda spectrometers are an ideal complementary tool for EDS analysis.

Overlap of silicon K and tungsten M lines are easily resolved using WDS instead of EDS.

Overlap of silicon K and tungsten M lines are easily resolved using WDS instead of EDS. Image Credit: EDAX

Scanning Modes

The Lambda spectrometers have the capability to scan across the complete energy range to cover a minimum of one X-ray line for each element from the periodic table.

Scanning mode options include the following:

  • Automatic acquisition of one or several EDS elements
  • Users can choose the speed and step size
  • Potential to tailor the scan range to users’ application utilizing manual input or spectral Swipe Mode
  • Peak and background modes available for a range of elements
    • Software indicates peak, diffractor and background positions
    • Users can define elements via an intuitive periodic table interface

Qualitative and Quantitative Analysis

The EDAX WDS software available with Smart Quant offers users quantitative and qualitative measurements. Users can collect and overlay WDS and EDS data in parallel for simple qualitative confirmation. The analyst can choose a method (EDS or WDS) for quantification of a preferred element to enhance accuracy and detection limits.

Features and Benefits

Compact Design

  • Suits all SEM chambers with an available high-angle port
  • Can be installed on standard EDS port—no unique chamber or port needed


  • Integrates X-ray optics and compact design to provide excellent count rates

High Count Rates and Peak-to-Background Ratios

  • Quick X-ray analysis comes at the best resolution
  • Ability to resolve a majority of the elemental overlaps
  • Superior resolution of the K lines of transition elements

Ease of Alignment

  • Automated routines enhance the operation, performance and accuracy of data

C in SiC showing superior resolution of WDS compared to EDS.

C in SiC showing superior resolution of WDS compared to EDS. Image Credit: EDAX

Smooth Integration with EDS and User-Friendly Software

  • Optimized X-ray microanalysis
  • Intuitive operation for WDS and EDS users
  • Covers the full periodic table

Smart Focus

The EDAX WDS software features the Smart Focus routine. The automated routine adjusts the sample height to focus the WDS signal and thus facilitate the maximum performance of the spectrometer.

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