APEX™ EBSD from EDAX is designed for the characterization of electron backscatter diffraction (EBSD) patterns within the easy-to-use APEX software system.
The combination of robust pattern examination and an intuitive interface enables users to gather and report high-quality data easily, rapidly, and reliably. Coupled with EDAX hardware, the APEX increases the productivity of users and offers the ideal solution for microstructural characterization.
Ease of Use
- Insightful operation for beginners and skilled users
- Analysis modes are arranged into application tabs with applicable functions fitted into logical groups in each tab
- Graphical ribbon bar allows rapid access to functions and features
- Smart functions for automatic improvement of data collection and reporting
APEX EBSD ribbon bar. Image Credit: EDAX
Adjustable Layouts
- Ability to resize and organize data view windows according to user preferences
- Numerous layouts available for each application tab that display applicable view windows for preferred operation
- Color schemes can be selected by users to match user preferences or the scanning electron microscope (SEM) interface
- Well-matched with a wide range of monitor configurations
- Custom layouts can be saved and reused
Context-sensitive layout selection. Image Credit: EDAX
User Customization
- Single or multi-user options
- Individual settings saved for each user
- Windows® Authentication for login can be used if required
Features
Triplet Indexing Engine
- Generates superior-quality indexing results on real-world samples
- Reduces sensitivity to rogue band detection with the exclusive three-bands (triplets) indexing method
- Improves band detection settings on the exclusive Hough page to allow for effective indexing of all crystal structures
- Patented Confidence Index value offers a quantitative quality measurement for the crystallographic indexing solution
- Realizes high indexing success rates with Triplet Indexing, even at rapid acquisition speeds of 4,500 indexed points per second using the Velocity™ Super EBSD camera
Triplet Indexing resolves overlapping patterns. Image Credit: EDAX
Comprehensive EBSD Data Collection
- A wide range of scan modes are available
- Individual EBSD patterns or a full scan can be easily collected
- Line scan acquisition
- Smart step size recommendations for effective scanning
- Hexagonal grid sampling for improved data sampling
- Atom Probe Assist™ mode is provided for tracking grain boundaries
- Smart detector optimization enables users to set up EBSD acquisition according to application requirements
Dynamic Scanning
- Users can monitor and evaluate data collection in real time with numeric and visual feedback during each scan
- Integrates grayscale and color maps to properly comprehend results
- Color maps comprise Confidence Index, Phase, IPF, and EDS Elements
- Hough band detection
- Data statistics summary
- Crystal unit cell display
- EBSD pattern and indexing display
- Feedback offers users with information on the quality of collection
- Grayscale maps include SEM signal, Image Quality, and PRIAS (optional)
Multiple scanning modes available. Image Credit: EDAX
Montage Large Area Mapping
- Scans large areas using stage movements to gather various fields of analysis
- Automatically stitches data into a single file for detailed analysis
- Oversampling available to enhance matching between fields
EBSD of a Gibeon Meteorite sample covering a 7.5 mm x 6.5 mm area using Montage for large area analysis. Image Credit: EDAX
Batch Scanning
- Gathers a series of scans as a single batch process
- Specifies typical free-form, Montage, and line scans for a batch
- Specifies the simultaneous EDS, magnification, step size, scan area, and stage location within the batch
- Allows efficient use of SEM for analyzing various samples or areas
Data Management
- Project tree structure for smooth organization of data
- HDF file format for data portability and management
- 64-bit software architecture for managing big data
- Single file for both EBSD and EDS collection
- Default names within project tree for rapid collection with option to rename if needed
- Can specify file name and location to match user requirements
- HDF file well-matched with APEX Review for EDS analysis and OIM Analysis™ for EBSD examination
Project tree data organization. Image Credit: EDAX
Integrated EDS-EBSD
- Complete integration of Energy Dispersive Spectroscopy (EDS) and EBSD for detailed materials characterization
- Employs innovative EDS quant engine enhanced for high-tilt EBSD geometries
- Integrated EDS spectrum with EBSD pattern collection to correlate structural and chemical information
- Concurrent EDS-EBSD scanning well-matched with ChI-Scan processing for improved multi-phase examination
Advanced Reporting
- Customizable report generation according to OIM Analysis user templates
- User-defined report content is available in template files with default design templates
- Personalized report layout with Report Designer tool
- Users can carry out reporting with batch scanning feature
- Users can create reports from APEX EBSD or from OIM Analysis software