EDAX APEX Software for Electron Backscatter Diffraction (EBSD)

APEX EBSD allows for the characterization of Electron Backscatter Diffraction (EBSD) patterns within the user-friendly APEX software platform.

The combination of powerful pattern analysis and an intuitive interface enables users to gather and report high-quality data easily, rapidly, and reliably. Coupled with EDAX hardware, the APEX increases users' productivity and offers the ideal solution for microstructural characterization.

APEX™ Software for EBSD

Image Credit: EDAX

Ease of Use

  • Intuitive operation for beginners and skilled users
  • Automatic optimization of EBSD detector and data collection parameters
  • Analysis modes are arranged into application tabs with applicable functions fitted into logical groups in each tab
  • Graphical ribbon bar allows rapid access to functions and features

APEX EBSD ribbon bar.

APEX EBSD ribbon bar. Image Credit: EDAX

Adjustable Layouts

  • Ability to resize and organize data view windows according to user preferences
  • Numerous layouts are available for each application tab that display applicable view windows for preferred operation
  • Color schemes can be selected by users to match user preferences or the scanning electron microscope (SEM) interface
  • Custom layouts can be saved and reused

Context sensitive layout selection.

Context sensitive layout selection. Image Credit: EDAX

User Customization

  • Single- or multi-user modes
  • Individual settings saved for each user
  • Windows® Authentication for login if required


Triplet Indexing Engine

  • The innovative three-bands (triplets) indexing approach reduces sensitivity to rogue band detection
  • With Triplet Indexing, users can achieve high indexing success rates even at the highest available speeds of the Velocity EBSD Detectors
  • The Patented Confidence Index value offers a quantitative quality measurement for the crystallographic indexing solution
  • Improve band detection settings on the devoted Hough page to ensure that all crystal structures are successfully indexed
  • Produce high-quality, indexing results on real-world samples

Triplet Indexing resolves overlapping patterns for better indexing.

Triplet Indexing resolves overlapping patterns for better indexing. Image Credit: EDAX

Comprehensive EBSD Data Collection

  • Multiple scan modes
  • Effortlessly collect individual EBSD patterns or a full scan
  • Line scan acquisition
  • Hexagonal grid sampling for enhanced data sampling
  • Automatic detector optimization for application-specific EBSD data collection
  • Automatic step size recommendations for efficient scanning

Dynamic Scanning

  • Users can monitor and evaluate data collection in real time with numeric and visual feedback during each scan
  • Combine grayscale and color maps to better comprehend the results
  • Grayscale maps incorporate Image Quality, SEM signal, and PRIAS (optional)
  • Color maps include IPF, Confidence Index, Phase, and EDS Elements
  • EBSD pattern and indexing display
  • Data statistics summary
  • Hough band detection
  • Crystal Unit Cell display
  • Feedback gives users information on collection quality

Multiple scanning modes available.

Multiple scanning modes available. Image Credit: EDAX

Montage Large Area Mapping

  • Scans large areas using stage movements to gather various fields of analysis
  • Automatically stitches data into a single file for detailed analysis
  • Oversampling is available to enhance matching between fields

EBSD mapping example from a high entropy alloy weld.

EBSD mapping example from a high entropy alloy weld. Image Credit: EDAX 

Batch Scanning

  • Gathers a series of scans as a single batch process
  • Specifies typical free-form, Montage, and line scans for a batch
  • Specifies the simultaneous EDS, magnification, step size, scan area, and stage location within the batch
  • Allows efficient use of SEM for analyzing various samples or areas

Data Management

  • Project tree structure for the seamless organization of data
  • HDF file format for data portability and management
  • 64-bit software architecture for managing big data
  • Single file for both EBSD and EDS collection
  • Default names within the project tree for rapid collection with the option to rename if needed
  • Can specify file name and location to match user requirements
  • HDF file well-matched with APEX Review for EDS analysis and OIM Analysis for EBSD examination

Project tree data organization.

Project tree data organization. Image Credit: EDAX

Integrated EDS-EBSD

  • Complete integration of Energy Dispersive Spectroscopy (EDS) and EBSD for detailed materials characterization
  • Utilize the innovative EDS quant engine that is enhanced for high-tilt EBSD geometries
  • Integrated EDS spectrum with EBSD pattern collection to correlate structural and chemical information
  • Simultaneous EDS-EBSD scanning compatible with ChI-Scan processing for enhanced multi-phase analysis

Advanced Reporting

  • Customizable report generation according to OIM Analysis user templates
  • User-defined report content is available in template files with default design templates
  • Personalized report layout with Report Designer tool
  • Use reporting with batch scanning capability
  • Users can create reports from APEX EBSD or OIM Analysis software

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