APEX™ Software for EBSD

APEX™ EBSD from EDAX is designed for the characterization of electron backscatter diffraction (EBSD) patterns within the easy-to-use APEX software system.

The combination of robust pattern examination and an intuitive interface enables users to gather and report high quality data easily, rapidly and reliably. Coupled with EDAX hardware, the APEX increases the productivity of users and offers the ideal solution for microstructural characterization.

Ease of Use

  • Insightful operation for beginners and skilled users
  • Analysis modes are arranged into application tabs with applicable functions fitted into logical groups in each tab
  • Graphical ribbon bar allows rapid access to functions and features
  • Smart functions for automatic improvement of data collection and reporting

APEX EBSD ribbon bar.

APEX EBSD ribbon bar. Image Credit: EDAX

Adjustable Layouts

  • Ability to resize and organize data view windows according to user preferences
  • Numerous layouts available for each application tab that display applicable view windows for preferred operation
  • Color schemes can be selected by users to match user preferences or the scanning electron microscope (SEM) interface
  • Well-matched with a wide range of monitor configurations
  • Custom layouts can be saved and reused

Context-sensitive layout selection.

Context-sensitive layout selection. Image Credit: EDAX

User Customization

  • Single or multi-user options
  • Individual settings saved for each user
  • Windows® Authentication for login can be used if required


Triplet Indexing Engine

  • Generates superior-quality indexing results on real-world samples
  • Reduces sensitivity to rogue band detection with the exclusive three-bands (triplets) indexing method
  • Improves band detection settings on the exclusive Hough page to allow for effective indexing of all crystal structures
  • Patented Confidence Index value offers a quantitative quality measurement for the crystallographic indexing solution
  • Realizes high indexing success rates with Triplet Indexing, even at rapid acquisition speeds of 4,500 indexed points per second using the Velocity™ Super EBSD camera

Triplet Indexing resolves overlapping patterns.

Triplet Indexing resolves overlapping patterns. Image Credit: EDAX

Comprehensive EBSD Data Collection

  • A wide range of scan modes are available
  • Individual EBSD patterns or a full scan can be easily collected
  • Line scan acquisition
  • Smart step size recommendations for effective scanning
  • Hexagonal grid sampling for improved data sampling
  • Atom Probe Assist™ mode is provided for tracking grain boundaries
  • Smart detector optimization enables users to set up EBSD acquisition according to application requirements

Dynamic Scanning

  • Users can monitor and evaluate data collection in real-time with numeric and visual feedback during each scan
  • Integrates grayscale and color maps to properly comprehend results
  • Color maps comprise Confidence Index, Phase, IPF and EDS Elements
  • Hough band detection
  • Data statistics summary
  • Crystal unit cell display
  • EBSD pattern and indexing display
  • Feedback offers users with information on the quality of collection
  • Grayscale maps include SEM signal, Image Quality and PRIAS (optional)

Multiple scanning modes available.

Multiple scanning modes available. Image Credit: EDAX

Montage Large Area Mapping

  • Scans large areas using stage movements to gather various fields of analysis
  • Automatically stitches data into a single file for detailed analysis
  • Oversampling available to enhance matching between fields

EBSD of a Gibeon Meteorite sample covering a 7.5 mm x 6.5 mm area using Montage for large area analysis.

EBSD of a Gibeon Meteorite sample covering a 7.5 mm x 6.5 mm area using Montage for large area analysis. Image Credit: EDAX

Batch Scanning

  • Gathers a series of scans as a single batch process
  • Specifies typical free-form, Montage and line scans for a batch
  • Specifies the simultaneous EDS, magnification, step size, scan area and stage location within the batch
  • Allows efficient use of SEM for analyzing various samples or areas

Data Management

  • The project tree structure for smooth organization of data
  • HDF file format for data portability and management
  • 64-bit software architecture for managing big data
  • Single file for both EBSD and EDS collection
  • Default names within project tree for rapid collection with option to rename if needed
  • Can specify file name and location to match user requirements
  • HDF file well-matched with APEX Review for EDS analysis and OIM Analysis™ for EBSD examination

Project tree data organization.

Project tree data organization. Image Credit: EDAX

Integrated EDS-EBSD

  • Complete integration of Energy Dispersive Spectroscopy (EDS) and EBSD for detailed materials characterization
  • Employs innovative EDS quant engine enhanced for high tilt EBSD geometries
  • Integrated EDS spectrum with EBSD pattern collection to correlate structural and chemical information
  • Concurrent EDS-EBSD scanning well-matched with ChI-Scan processing for improved multi-phase examination

Advanced Reporting

  • Customizable report generation according to OIM Analysis user templates
  • User-defined report content is available in template files with default design templates
  • Personalized report layout with Report Designer tool
  • Users can carry out reporting with batch scanning feature
  • Users can create reports from APEX EBSD or from OIM Analysis software

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