APEX™ Software for EBSD

APEX™ EBSD from EDAX is designed for the characterization of electron backscatter diffraction (EBSD) patterns within the easy-to-use APEX software system.

The combination of robust pattern examination and an intuitive interface enables users to gather and report high-quality data easily, rapidly, and reliably. Coupled with EDAX hardware, the APEX increases the productivity of users and offers the ideal solution for microstructural characterization.

Ease of Use

  • Insightful operation for beginners and skilled users
  • Analysis modes are arranged into application tabs with applicable functions fitted into logical groups in each tab
  • Graphical ribbon bar allows rapid access to functions and features
  • Smart functions for automatic improvement of data collection and reporting

APEX EBSD ribbon bar.

APEX EBSD ribbon bar. Image Credit: EDAX

Adjustable Layouts

  • Ability to resize and organize data view windows according to user preferences
  • Numerous layouts available for each application tab that display applicable view windows for preferred operation
  • Color schemes can be selected by users to match user preferences or the scanning electron microscope (SEM) interface
  • Well-matched with a wide range of monitor configurations
  • Custom layouts can be saved and reused

Context-sensitive layout selection.

Context-sensitive layout selection. Image Credit: EDAX

User Customization

  • Single or multi-user options
  • Individual settings saved for each user
  • Windows® Authentication for login can be used if required


Triplet Indexing Engine

  • Generates superior-quality indexing results on real-world samples
  • Reduces sensitivity to rogue band detection with the exclusive three-bands (triplets) indexing method
  • Improves band detection settings on the exclusive Hough page to allow for effective indexing of all crystal structures
  • Patented Confidence Index value offers a quantitative quality measurement for the crystallographic indexing solution
  • Realizes high indexing success rates with Triplet Indexing, even at rapid acquisition speeds of 4,500 indexed points per second using the Velocity™ Super EBSD camera

Triplet Indexing resolves overlapping patterns.

Triplet Indexing resolves overlapping patterns. Image Credit: EDAX

Comprehensive EBSD Data Collection

  • A wide range of scan modes are available
  • Individual EBSD patterns or a full scan can be easily collected
  • Line scan acquisition
  • Smart step size recommendations for effective scanning
  • Hexagonal grid sampling for improved data sampling
  • Atom Probe Assist™ mode is provided for tracking grain boundaries
  • Smart detector optimization enables users to set up EBSD acquisition according to application requirements

Dynamic Scanning

  • Users can monitor and evaluate data collection in real-time with numeric and visual feedback during each scan
  • Integrates grayscale and color maps to properly comprehend results
  • Color maps comprise Confidence Index, Phase, IPF, and EDS Elements
  • Hough band detection
  • Data statistics summary
  • Crystal unit cell display
  • EBSD pattern and indexing display
  • Feedback offers users with information on the quality of collection
  • Grayscale maps include SEM signal, Image Quality, and PRIAS (optional)

Multiple scanning modes available.

Multiple scanning modes available. Image Credit: EDAX

Montage Large Area Mapping

  • Scans large areas using stage movements to gather various fields of analysis
  • Automatically stitches data into a single file for detailed analysis
  • Oversampling available to enhance matching between fields

EBSD of a Gibeon Meteorite sample covering a 7.5 mm x 6.5 mm area using Montage for large area analysis.

EBSD of a Gibeon Meteorite sample covering a 7.5 mm x 6.5 mm area using Montage for large area analysis. Image Credit: EDAX

Batch Scanning

  • Gathers a series of scans as a single batch process
  • Specifies typical free-form, Montage, and line scans for a batch
  • Specifies the simultaneous EDS, magnification, step size, scan area, and stage location within the batch
  • Allows efficient use of SEM for analyzing various samples or areas

Data Management

  • The project tree structure for smooth organization of data
  • HDF file format for data portability and management
  • 64-bit software architecture for managing big data
  • Single file for both EBSD and EDS collection
  • Default names within project tree for rapid collection with option to rename if needed
  • Can specify file name and location to match user requirements
  • HDF file well-matched with APEX Review for EDS analysis and OIM Analysis™ for EBSD examination

Project tree data organization.

Project tree data organization. Image Credit: EDAX

Integrated EDS-EBSD

  • Complete integration of Energy Dispersive Spectroscopy (EDS) and EBSD for detailed materials characterization
  • Employs innovative EDS quant engine enhanced for high-tilt EBSD geometries
  • Integrated EDS spectrum with EBSD pattern collection to correlate structural and chemical information
  • Concurrent EDS-EBSD scanning well-matched with ChI-Scan processing for improved multi-phase examination

Advanced Reporting

  • Customizable report generation according to OIM Analysis user templates
  • User-defined report content is available in template files with default design templates
  • Personalized report layout with Report Designer tool
  • Users can carry out reporting with batch scanning feature
  • Users can create reports from APEX EBSD or from OIM Analysis software

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