The Scanning Kelvin Probe from KP Technologies - Operation and Capabilities

Prof. Iain D. Baikie from KP Technology introduces us to the Scanning Kelvin Probe which measures the work function difference between a vibrating tip and the sample. It is suited to the analysis of such things as metals, electronic devices, patterned wafers, solar cells etc and can carry out similar functions to an AFM.

Thw Scanning Kelvin Probe can be used for corrosion studies, polymer films enc electronics and other materials analysis. It is able to detect films as thin as a molecule thick and can create detailed 3-D maps of a sample surface.

It is a simle technique to use and takes very rapid measurements.

Run time - 3:40 min

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