NanoIR Opens Up New Materials Characterization Opportunities

Curt Marcott from Light Light Solutions tells us about his experiences characterizing materials using the NanoIR from Anasys Instruments. In particular he was excited by the fact that the technique combines AFM and IR spectroscopy, and has spatial resolution an order of magnitude better than conventional IR, which means you can characterize various features of a sample, or even analyze compositional differences across an interface.

While his interview focusses on polymeric materials, he stresses that the technique has many other possibilities, such as biological systems.

Run time - 6:44min

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