Direct Position Measurement from PI
This video shows an animation of Direct Position Measurement from Physik Instrumente (PI), demonstrating how maximum accuracy can be achieved through direct metrology. When directly measuring positions using non-contact sensors, each change in position of the moving platform is directly captured by the controller relatively to the base body.
There are no guiding or drive elements, which would impact the measurement, between the measured point and moving platform. This technique allows a bandwidth in kilohertz range, resolution in sub-nanometer range, and superior stability.
Run Time - 0:34min
Nanopositioning: Why Parallel-Metrology is Better, by www.nanopositioning.net