Lambda TriA-SNOM Scanning Near-Field Optical Microscope

APE Research's TriA-SNOM microscope is capable of collecting optical signals in reflection, transmission and back-reflection modes. The instrument is suitable for surface science, optics and biological applications

  • Ease of Use
  • Versatility
  • Easily interchangeable Samples
  • Easy switching between acquisition modes
  • Lateral Resolution better then 50 nm

Tri-SNOM is a microscope that allows the acquisition of three different and simultaneous optical signals, in addition to the topography of the sample.

The working modes of this instrument are shown in the figure. The incident light is coupled into a metal covered optical fiber with a tip aperture d << l ( = light wavelength). The near-field component of the incident light is transmitted through the aperture and scattered by the surface of the sample.

The microscope can collect the reflected light (illumination-reflection mode), the component of the light crossing the sample (illumination-transmission mode), and the near-field component back scattered into the fiber (illumination-collection mode). The collection mode gives information on the optical density of the surface layer of the sample, and presents a high spatial resolution and few artifacts due to the diffraction. The reflection and transmission modes give information respectively on a ticker part of the surface layer and on the whole thickness of the sample.

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