MaxMile EpiEL Wafer Electroluminescence Mapping System

MaxMile EpiEL system is a virtual LED device fabrication & characterization system which can be used to measure LED device parameters directly on epiwafers. Without any costly and time-consuming device fabrication, yet as through a finished device, EpiEL reveals not only the electro-luminescence (EL) but also the electrical properties of the material.

EL measurement is usually performed on finished device (such as LED) since it needs a device structure to inject current. MaxMile EpiEL technology overcomes this limitation by instantly forming a well-defined LED device inside the material. With such unique capability, MaxMile EpiEL technology provides an unprecedented electroluminescence solution for  optoelectronic (especially emerging solid-state lighting) industry which brings new capability and better efficiencies.

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