The NANOS is a next-generation tabletop SEM with high-resolution imaging (< 8 nm) and integrated energy dispersive spectroscopy (EDS) for rapid, precise elemental analysis at a low cost of ownership. Its small size, durable construction, and plug-and-play configuration make it perfect for R&D, educational, and industrial applications that do not require dedicated infrastructure.
Key Features
- Mixed Mode Imaging: Viewing SE and BSE simultaneously, with the possibility to overlay
- Topographical Mode: Advanced surface imaging with shading effects is made possible by 4-quadrant BSD
- Low Maintenance and Service Costs: Detachable panels, user-serviceable parts, and modular components
- < 8 nm Resolution
- EDS – Point Analysis, Line Scan, and Element Mapping
- High-Performance SE and 4 Quadrants BSE Detectors
- Low Vacuum Capability
- Eucentric Tilt Stage (Standard)
- 1 to 20 kV Acceleration Voltage
- 1000+ hours Filament Lifetime Performance.
Semplor Discover Software Platform
Integrated EDS Analysis
- Map Spectrum Selection
- Line Scan Analysis
- All-in-One Project Structure
- One-Click Reporting
- High Count-Rate
- Live Mapping for Instant Visual Feedback
- Instant Element Identification and Quantification
- Advanced Map Blending.
Semplor Explore Apps
Explore Particles
- Visual overlays with statistical reports that can be exported
- Automated particle, pore, or grain detection and measurement
- Size, area, perimeter, shape descriptors, and count distributions
- Multiple segmentation methods (thresholding, watershed).
Explore Fibers
- Perfect for electrospun materials, textiles, and nonwovens
- Precise tracking of fibers that touch or overlap
- Orientation distributions and pore characteristics
- Diameter, orientation, and curvature measurements.
Explore 3D
- Renders a single image for quick 3D visualization
- Stereo pair reconstruction from tilted images
- 3D reconstructions and quantitative height maps
- 4-quadrant BSD topography from a single scan.
Specifications
Source: Semplor
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IMAGING
MODE |
Optical |
2 and 12x optical with up to 60x digital zoom |
| SEM |
Magnification range: 100 to 200.000x |
| Resolution |
< 8 nm |
| Capture resolution |
Up to 4096 x 4096 pixels (4K) |
| ILLUMINATION |
Light optical |
Bright field |
| Electron optical |
Optimized thermionic source (tungsten)
Lifetime: 1000+ operating hours in ECO-mode |
| Acceleration voltages |
Default: 1, 2, 5, 7, 10, 15 & 20 kV |
| DETECTOR |
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Secondary electron detector (SED)
Backscattered electron detector (BSD) – 4-quadrant
Energy Dispersive Spectroscopy detector (EDS) – embedded |
LIGHT OPTICAL
NAVIGATION CAMERA |
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Color |
IMAGE
FORMATS |
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JPEG, TIFF, PNG, BMP |
USER
INTERFACE |
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Communication, imaging, and analysis use a single monitor with control via a wireless mouse & keyboard
Remote control and diagnostic enabled |
| DATA STORAGE |
|
Network, USB, workstation |
SAMPLE
STAGE |
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Eucentric tilt stage (+15 ° up to -40 ° ) manual
Computer-controlled motorized X, Y: 25 x 25 mm |
| SAMPLE SIZE |
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Up to 45 mm diameter (max +15 ° to -15 ° tilt)
Up to 19 mm height (optional 40 mm) |
EDS
SPECIFICATIONS |
Detector type |
Silicon Drift Detector (SDD), thermo-electrically cooled |
| Detector active area |
30 mm2 |
| Energy resolution |
@ Mn Kα < 132 eV |
| Max. input count rate |
300,000 cps |
| Hardware integration |
Fully embedded SDD, pulse processor, and scan generator |
| SOFTWARE |
|
Installed on a Windows PC and controlled via a user interface
EDS point analysis, line analysis, and mapping
Export functions |
SYSTEM
SPECIFICATIONS |
Footprint |
280 (w) x 470 (d) x 550 (h) mm |
| Weight |
62 kg |
| Pumps |
Pfeiffer Turbo molecular pump and an oil-free membrane pre-vacuum pump |
| Vacuum modes |
High vacuum SEM mode (standard)
Low vacuum mode (standard): vacuum of 40 Pascal for reduced charging
Motor-controlled vacuum levels via the User Interface |
| Workstation |
Preconfigured All-in-One PC with a 27” monitor. SEM imaging and EDS Analysis software installed |
AMBIENT
CONDITIONS |
Temperature |
15 °C - 25 °C (59 °F - 77 °F) |
| Humidity |
20 to 80 % RH |
| Power |
System typically in imaging mode: 110 W (max. 140 W) |
Applications
- Elemental analysis and mapping
- Routine imaging offloads floor-model SEMs
- Surface topography and 3D imaging
- Educational and training applications
- Materials characterization and quality control
- Particle and fiber analysis
- R&D across multiple industries.