Laser Scan Micrometer LSM-9506 from Mitutoyo America

Laser Scan Micrometer LSM-9506 Series 544-Bench Top Type Non-contact Measuring System.


Linearity (*2)
± .0001in (±2.5µm)
The optical axis direction
± .0001in (±2.5µm)
The scanning direction
±(.00008+L/10000)in [L:inch] (*3)
±(2.0+L/10)µm [L:mm] (*3)

Measuring Function

Segment designation: 1 to 7 (1 to 3 for Transparent)
10 Program storage (PROG. 0 to PROG. 9)
255 Edge Designations can be detected
Multi Limit GO/±NG Tolerance
Judgment (up to 7 intervals)
Dual-Axis LED Display
Offset Setting and Mastering
Reference Value Setting
Automatic Workpiece Detection
Dual-Gage Calibration
Inch/mm Conversion
Abnormal Data Elimination
Dual Program Measurement
Statistical Processing
Workpiece Position display
Foot-switch Connector

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