Alemnis’ Atomic Force Microscope (AFM) LiteScope

The Alemnis nanoindenter module (ASA) is an optional accessory for the atomic force microscope (AFM) LiteScope, designed for incorporation with scanning electron microscopes.

Alemnis’ Atomic Force Microscope (AFM) LiteScope

Image Credit: Alemnis AG

The combination of three complementing methods allows micromechanical tests to be carried out while seeing the specimen with outstanding SEM magnification and analyzing the indented specimen with sub-nanometer precision using LiteScope. This one-of-a-kind system is intended for maximum adaptability, allowing for a wide range of creative and complicated applications.

Alemnis’ Atomic Force Microscope (AFM) LiteScope

Image Credit: Alemnis AG

Added Values

  • Quantitative analysis of mechanical properties (hardness, Young’s modulus, activation volume)
  • Accurate analysis of indent topography and roughness of pre-indented samples
  • Use of SEM and AFM analyses for effective nanoindentation spot selection
3 in 1: Nanoindentation in correlative AFM-in-SEM measurements webinar by NenoVision & Alemnis

Video Credit: Alemnis AG

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