Oxford Instruments’ TrueSurface microscopy module integrates an optical profilometer with Raman imaging to trace the surface of inclined or textured samples during 3D molecular characterisation.
The sensor's closed-loop operation can compensate for variations in temperature or humidity during measurements with long integration times, resulting in consistently detailed images. Both profilometry and Raman data are acquired through the same optical axis for fast and convenient one-pass operation.
Investigations on pharmaceutical tablet coatings, geological samples, composite emulsions, semiconductors and many other applications can benefit from TrueSurface.
Key Features
- One-pass simultaneous optical profilometry and Raman imaging.
- 3D chemical characterisation on inclined or textured samples.
- Requires minimal, if any, sample preparation.
- Closed-loop operation eliminates variations during long measurements.
- Maintains optimum focus along, or at a set distance from, the sample surface.
Image Credit: Oxford Instruments
Topographic Raman microscopy image of micro-structured silicon. Image Credit: Oxford Instruments
Topographic Raman microscopy image of a pharmaceutical tablet with corresponding spectra. Image Credit: Oxford Instruments
Topographic Raman microscopy image of cellulose fibers. Image Credit: Oxford Instruments