NANOS EBSD Tabletop SEM for Microstructural Analysis

The NANOS EBSD integrates high-resolution SEM imaging with electron backscatter diffraction (EBSD) analysis in a compact and user-friendly tabletop platform.

By examining diffraction patterns, it precisely captures microstructural details such as crystal orientation, phase, and grain structure. Additionally, the built-in energy-dispersive spectroscopy (EDS) allows for simultaneous elemental and crystallographic analysis within a single system.

A eucentric tilt stage, capable of tilting up to 70°, ensures that the area of interest remains centered and in focus during the transition between imaging and EBSD acquisition, a distinctive feature among tabletop SEMs.

Key Features

• Eucentric Tilt of up to 70°: Maintains the region of interest in focus and centered while tilting
• Crystallographic Analysis in a Tabletop SEM: Obtain information on crystal orientation and structure directly from the system
• Fast and Reliable Orientation Mapping: Quickly map crystal orientations throughout the sample
• Phase Identification: Recognize and differentiate various crystalline phases
• Compact and Integrated Design: Fully integrated EBSD functionality within a compact configuration
• Combined EDS and EBSD Platform: Seamlessly transition between EDS and EBSD analysis within the same system
• Resolution of less than 8 nm
• Acceleration Voltage ranging from 1–20 kV
• Over 1000 hours of Filament Lifetime Performance (ECO-mode)

Eucentric Tilt: The Key to Seamless EBSD

The integration of eucentric tilt with EBSD facilitates a smooth transition between imaging and crystallographic analysis.

Samples can be captured at both the 0° and 70° EBSD positions by simply tilting the stage, eliminating the need to break vacuum or adjust the sample's position.

Since the field of view, working distance, and focus remain consistent during the tilting process, an area identified during imaging can be directly transferred to the EBSD position without losing sight of the region of interest. This makes the transition between imaging and EBSD rapid, intuitive, and highly reproducible.

Bruker e-Flash XS Detector

• Connection: True plug-and-play (PnP) device; data and power transfer via USB 3.0 cable
• Detector Technology: CMOS imaging chip technology
• Phosphor Screen: User-replaceable
• Native Image Resolution: 720 × 540 pixels
• Scan Generator: QUANTAX Scan system (external scan generator)
• Binning Modes: 2×2, 3×3, 4×4, 5×5, 6×6
• Speed: Up to 520 frames/second (fps) in all binning modes
• Optics: Custom-made optics system with field lens for maximizing light efficiency
• Dimensions: Length ∼84 mm (3.31 in), diameter ∼48 mm (1.89 in)
• Weight: 0.85 kg

Bruker ESPRIT Software

• Interface: Acquisition and processing of EBSD data utilizing the ESPRIT software interface
• Processing Speed: Employs multithreaded technology for rapid reindexing of EBSD data at rates of up to 60,000 points per second
• Signal Optimization and Indexing: A variety of automated and semi-automated features available for signal enhancement and pattern indexing
• Phase Editor: Simplified creation and/or modification of phase entries utilized in pattern indexing
• Misorientation Analysis: Features for analyzing misorientation distribution
• Grain Reconstruction: Automatic reconstruction of grains and calculation of statistics, including size, shape, and main-axis inclination
• Grain Boundary Analysis: Incorporating CSL
• Data Processing: Various options for creating and processing multiple subsets
• Texture Analysis: Features for representing orientation distribution and crystallographic texture
• Phase Databases: Inclusion of the Bruker Phase Database and the American Mineralogist Phase Database
• Reporting: Capability to generate and export reports
• Data Export: Ability to export maps and histograms in text and standard image formats such as JPEG, PNG, Bitmap, and TIFF

Specifications

Source: Semplor

Applications

Source: Semplor