Tabletop Scanning Electron Microscopes (SEM) - EM-30 Series

The EM-30 Series available from COXEM is a high-resolution tabletop scanning electron microscope (SEM) that has capabilities and specifications unmatched by any other SEM in its price range.

Your search to find the ideal compact SEM will come to an end once you have evaluated the EM-30 Series. The companion models of the EM-30AX Series contain in-built EDS elemental micro-analysis.

Three different versions of the EM-30 Series are:

  • EM-30 NEXT – comes with Low Vac mode, NEW DSP Imaging Electronics, and built-in NavCam
  • EM-30 LE – similar to the NEXT model, but with CeB6 source (CeBix or cerium hexaboride)
  • EM-30 PLUS – an entry-level version of the EM-30, with the ability to be upgraded at a later date 

Available with both SE and BSE detectors, the EM-30 allows the operator to view either detector individually, side-by-side, or as a composite image for a better understanding of microstructure and chemistry.  Low Vacuum mode allows the operator to image non-conductive samples without any special pre-treatment, while a built-in optical camera helps to manage multi-sample holders and simplify navigation using our “Macro-Micro-Nano” sample views. 

COXEM’s EM-30 series tabletop scanning electron microscope is the only tabletop SEM available with either CeB6 or tungsten electron sources. No other suppliers can guide users regarding the most suitable solution for their applications and laboratory situation. While the operating cost of tungsten filament sources is low, a CeB6 source offers a brighter image at low kV beam excitation for improved signal-to-noise.

Powered by NanoStation software, the EM-30 seamlessly integrates all SEM functions with EDS routines such as compositional particle analysis, and provides advanced image analysis tools like line profile analysis to more accurately determine particle size when working at the nanoscale.  Automated features like near real-time automatic brightness/contrast simplify operation and help novice users achieve consistent results.

An optional STEM detector allows the EM-30 to utilize its 30 kV accelerating voltage capability to perform TEM analysis of samples on standard TEM grids, while the optional CoolStage allows analysis of samples from -25°C to 50°C.   

COXEM’s EM-30 series tabletop scanning electron microscope is the only tabletop SEM provided with CeB6 or tungsten electron sources. No other suppliers can guide users regarding the most suitable solution for their applications and laboratory situation. While the operating cost of tungsten filament sources is low, a CeB6 source offers a brighter image at low kV beam excitation for improved signal-to-noise.

Other Equipment by this Supplier