The IR SMAL is a specialized version of the Super-resolution Microsphere Amplifying Lens, specifically engineered for infrared applications.
All configurations of SMAL can be modified for operation within the IR spectrum, facilitating super-resolution imaging across wavelengths generally spanning from 800 nm to 1200 nm.
This expansion enhances the utility of SMAL technology in fields that necessitate IR detection and analysis.
Product Codes:
OLMC-001-W-IR → RMS thread, 69.9 mm parfocality, immersion
OLMC-001-W-UNI-M25-IR → M25 thread, 60 mm parfocality, immersion
OLMC-001-W-UNI-RMS-IR → RMS thread, 45 mm parfocality, immersion
ALMC-001-D-IR → RMS thread, 69.9 mm parfocality, dry
ALMC-001-D-UNI-M25-IR → M25 thread, 60 mm parfocality, dry
ALMC-001-D-UNI-RMS-IR → RMS thread, 45 mm parfocality, dry
BIOL-001-OW-M25-IR → M25 thread, 60 mm parfocality, large FOV
BIOL-001-OW-RMS-IR → RMS thread, 45 mm parfocality, large FOV
MULT-001-BIO-M25-IR → M25 thread, 60 mm par., multisphere, immersion
MULT-001-BIO-RMS-IR → RMS thread, 45 mm par., multisphere immersion
MULT-001-SEM-M25-IR → M25 thread, 60 mm parfocality, multisphere, dry
MULT-001-SEM-RMS-IR → RMS thread, 45 mm parfocality, multisphere, dry
Key Features
- Optimized for the infrared spectrum (800-1200 nm)
- Exhibits super-resolution capabilities reaching down to 100 nm within the IR range
- Expands the applications of SMAL into domains sensitive to infrared
- Compatible with current SMAL configurations (dry, immersion, wide field of view, multi-sphere)
- Appropriate for integration into customized microscope systems or third-party microscopes
Intended Applications
- Inspection of infrared microchips and semiconductors
- Characterization of materials using infrared wavelengths
- Applications in life sciences that necessitate infrared imaging
- Focused studies in infrared spectroscopy and microscopy
Specifications
Source: LIG Nanowise Limited
| Attribute |
Description |
| Wavelength Range |
800-1200 nm (infrared spectrum) |
| Resolution |
Super-resolution capability adapted to IR applications |
| Compatibility |
All SMAL configurations (dry, immersion, wide FOV, multi-sphere) |
| Integration |
Easily integrated into customised microscope systems for IR use |
Usage Notes
- Tailored for applications that require infrared wavelengths
- Most appropriate for incorporation with IR detectors and specialized optical configurations
- Guarantees nanoscale imaging proficiency throughout the IR spectrum while using current SMAL designs
Capture of metal interconnects using IR SMAL Dry. Image Credit: LIG Nanowise Limited