The ARLTM QUANT’X EDXRF Spectrometer from Thermo Scientific is highly efficient, extremely easy to use and affordable to own. It gives researchers and manufacturers a cutting-edge tool to solve their most difficult analytical problems across a broad array of applications.
Analysts can take advantage of:
- Measurement times of 10–60 seconds per condition
- Quick elemental analysis from carbon (fluorine) to americium
- Sensitivity from <1 ppm up to 100%
- Numerous options for sample presentation
- Imaging sample with CCD camera
- High-end silicon drift detector (SDD) with thermoelectric cooling
- Adjustable X-Ray beam size from 1 to 15 mm
- Versatile XRF application software
- Supports Multi-language
- Thickness and layer analysis
- Thermo Scientific™ UniQuant™ Software for superior standard-less analysis
- Optional TRACEcom for easy interfacing with LIMS
- Easy installation and maintenance
- Mechanical durability for trouble-free operation
- Low noise thanks to cooling-on-demand fan speed
- Compact footprint and effortless mobility
- Fully customizable and upgradeable on-site
The ARL QUANT’X EDXRF Spectrometer has evolved into a comprehensive package that includes established hardware and all-inclusive software in a robust design — all supported by pre-installed applications or on-site process development by experts — thanks to customer feedback and expert advice.
The instrument’s uptime is ensured by an experienced and responsive service organization. All the analyst has to worry about now is the next analytical challenge, thanks to Thermo Scientific’s expertise in dozens of effective XRF applications.
Building on Proven Success
The ARL QUANT’X Spectrometer does have a long history as the industry standard in EDXRF. The ARL QUANT’X Spectrometer has incorporated technologies to enhance EDXRF performance ever since its introduction. This benchtop EDXRF instrument has progressed into a versatile, compact and high-performing instrument, starting with the world’s first Peltier cooled Si(Li) detector.
The new generation silicon drift detector (SDD) is at the heart of the QUANT’X, which is coupled to a fast CMOS ASIC preamplifier for high count rates and outstanding resolution.
The massive detector area ensures a large solid angle, which maximizes X-Ray capture from the sample. In addition to a Be window, a graphene window can be added to the detector to improve light element sensitivity. The graphene window reduces the detectable element range to carbon and enhances Na, F and Mg detection limits substantially.
Even when analyzing small samples or using collimators as small as 1 mm, a 50-watt high-power X-Ray tube helps in effective excitation. The option of nine primary beam filters makes determining the best excitation condition simple. The ARL QUANT’X Spectrometer can analyze samples in helium, air or vacuum, ensuring optimal light element analysis for any loose powder, liquid or solid.
The sensitivity of the new ARL QUANT’X Spectrometer has been improved over its predecessor thanks to a combination of enhanced electronics, a new detector and detector window, an enhanced X-Ray tube and optimized geometry.
The ARL QUANT’X EDXRF Spectrometer generally functions at an incoming count rate of over 200 Kcps at the same time maintaining a typical resolution of 135 eV FWHM at Mn Kα. This guarantees high counting statistics in a short measurement time, resulting in outcomes that are more accurate than ever before.
The ARL QUANT’X Spectrometer has a smaller footprint that fits in any lab while enhancing performance. It only necessitates a standard power outlet and helium when analyzing loose powders or liquids that necessitate that atmosphere. The Peltier cooled SDD is already operational a few minutes after the device is plugged in.
Calibration curve for carbon in cast iron using the detector with graphene window. Image Credit: Thermo Fisher Scientific - Elemental Analyzers and Phase Analyzers
Working with X-Rays necessitates extreme caution. When X-Rays are on, the ARL QUANT’X Spectrometer has an interlock-based fail-safe circuit design and a clear illuminated warning sign.
The X-Ray tube is turned off totally between measurements and when the chamber lid is opened, further enhancing the operator’s safety. In this regard, the ARL QUANT’X Spectrometer complies with the most stringent international safety rules and norms.
Enhanced Analytical Software
The latest WinTrace analytical software, which runs on Windows 10, takes advantage of EDXRF’s inherent flexibility by utilizing advanced algorithms and practices refined over years of research and experience.
It enables the collection and processing of nine filtered spectra per sample for any number of analytes, applies one of several analytical algorithms and includes as many or as few calibration standards as needed; even one calibration standard can suffice.
Spectra can always be reprocessed and recalculated off-line once they have been collected. Any sample — slag, air filter, oil, metal or rock — will be analyzed using its own distinctive optimal setting thanks to automatic X-Ray power adjustment.
Simple and User-Friendly
Even the most sophisticated hardware in a digital world would be constrained without flexible software created to take full advantage of it. Advanced users can access every parameter in the Method Explorer interface to get the best throughput, selectivity and sensitivity in any application.
Users can simply click on a periodic table to add or remove elements. A tree-style interface is used to review calibrations and results. Creating methods using common application templates is also possible. Using the Standards Library provides access to a database that houses all of the information on reference materials, standards and sample compositions.
While the spectroscopist values complete control and fine-tuning, speed and ease of use are essential in an industrial setting.
WinTrace allows shortcuts that have the preferred method preloaded to be created. The operator only needs to type in the sample name and hit the Analyze button. Spectra and results are automatically saved into the method once they have been measured. All of the analysis data is kept in one place for easy access.
The extraction of peak intensities from spectra with precision is a crucial first step in any quantitative analysis. Advanced deconvolution algorithms allow for the accurate extraction of net peak intensities from spectra with many element lines. Escape peaks and sum peaks are automatically taken care of. Most applications work with pre-defined settings, which can be easily customized for the most difficult cases.
WinTrace provides a clear overview of any calibration with easy access to individual data of every standard and unknown sample. The tree-type interface guides the user through the different steps of a typical EDXRF analysis. Image Credit: Thermo Fisher Scientific - Elemental Analyzers and Phase Analyzers
Looking up the details of a measurement or evaluating a spectrum is straightforward using Method Explorer. Image Credit: Thermo Fisher Scientific - Elemental Analyzers and Phase Analyzers