The DME DS95 CompactGranite from Semilab delivers an advanced AFM performance with the lowest cost per measurement for academia and industry, as well as the utmost ease of use.
The available options and the modular system design offer plenty of opportunities for upgrading through standard accessories, or finalizing the system with user-specified or customized supporting components.
- The DS 95 AFM scanner has a compact design that ensures excellent scan rates and stability
- A high resolution optical camera allows detailed views of samples
- The completely digital C-32 SPM control electronics offer spearhead imaging control and feedback performance
Ease of Use
- The special option for plug-and-play cantilever exchange ensures rapid and safe operation of the system
- Samples can be freely accessed from the sides for unique stages and sample holders
- The AFM scanner has a built-in optical axis that allows complete visual control during approach and positioning
The simple design ensures a low entry level in high end AFM instruments. Several upgrade possibilities help simplify the system for the needed application.
With the DS 95 SPM scanner range, Semilab offers the ultimate combination of performance and ease of use. The DS 95 SPM scanners reflect a decade-long experience in the domain of SPM application and manufacturing to help users realize the best and most consistent results in the shortest time possible.
The DME DS 95 CompactGranitestage makes it possible to analyze almost all specimens by SPM. The compact granite stage will surprise users with its versatility, from a splitter of a coated-wafer to a complete nanocoated surgical implant. Thus, the design does not compromise in terms of stability. Atomic layers can also be scanned on a standard writing desk.
The open-tip scanner design provides space to freely access the samples and includes a wide range of chosen XY translators and unique measurement stages as a liquid cell or temperature control stage.
Tailored illumination or sample holders and sample stages for exclusively shaped sample objects are also offered.
Magnetic force microscopy on MnAS thin film sample. Domains with different magnetic orientations are visualized in the phase image. Image acquired with DME DS 95 Compact granite SPM system. Image Credit: Semilab Semiconductor Physics Laboratory