High Sensitivity, High Resolution and High Stability ICP-OES Spectrometer.
- The Ultima Expert is specially designed to handle the most challenging applications and offers the highest performance on the market
- Total plasma view and radial viewing provide the lowest detection limits in ICP-OES spectrometry
- Unique sheath gas feature offers unrivalled stability on samples with high total dissolved solids content, up to 30% dissolved solids
- Continuous wavelength coverage from 120 to 800 nm with Far UV option and improved sensitivity for halogens analysis or the use of alternative wavelengths
- Its high-quality optical design integrates a high density holographic grating and one meter focal length to provide the highest resolution on the market as well as high stability and sensitivity for the most demanding applications
- Unmatched spectral resolution minimizes interference with <5 pm for wavelengths in the range 120 - 320 nm
- Optional dual grating system, provides <6 pm resolution up to 450 nm for line-rich matrices such as geological or precious metals, and rare earth elements applications
- Patented HDD® detection provides sub-ppb to percent level in a single analysis
- Dynamic range of up to 10 orders of magnitude using Image
- Unique HiStab device can achieve exceptional stability for demanding applications
- Optional 0.5 m or 1 m polychromator for simultaneous analysis
Image Navigator
- Full spectrum display with multiple spectra display capability
- Image navigator is designed for semi-quantitative analysis, thanks to full spectrum acquisition
- Automated semi-quantitative and qualitative analysis
- Visual comparison with overlaid spectra display capability
MASTER, Find Easily the Right Wavelength
- MASTER enables method development by performing automatic selection of appropriate lines according to the concentration range of each element and the matrix. MASTER is based on the proprietary S3-base developed with real ICP spectra acquisitions and containing over 50,000 wavelengths identified with full spectroscopic data.
- Automatic wavelength selection
- Sensitivity, interference level, and dynamic range criteria to adjust line selection
- Synthetic spectra display
S3-base Viewer
- The entire S3-base database is displayed on the S3-base viewer, which helps to identify emission lines in unknown samples.
- Full S3-base database available
- Display of the list of potential emission lines, including plasma inherent lines, near a selected wavelength with their detection limits and relative intensities
- Display of analyte wavelength and its detection limit and relative intensity
- Graphic display of analyte emission line and potential emission lines for facilitated identification