X-Ray Analytical Microscope: XGT-9000

The XGT-9000 X-ray analytical microscope from HORIBA Scientific is an evolution of μXRF. The microscope offers a combination of enhanced sensitivity and new imaging technology to realize the high-speed analysis of foreign materials using a single unit.

Features

  • Easy analysis operation without the need for preparation and non-destructive analysis
  • Complete with a range of image analysis software provided
  • Measurement points can be rapidly accessed via high precision optical observation, even in the microscopic range
XGT-9000

Video Credit: HORIBA Scientific

Clear and High-Speed Image Mapping

  • Reduced analysis time ensures efficient measurement work
  • X-ray images with very limited noise enable even clearer observation

Clear and High Speed Image Mapping

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Clear Optical Image Observation and Coaxial X-Ray Irradiation

  • Fitted with three types of illumination: transmitted, around and coaxial. Integrating coaxial and around illuminations allows clear observation of samples with regions that are mirrored, non-uniform, etc.

Clear Optical Image Observation and Coaxial X-Ray Irradiation

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  • Coaxial, perpendicular X-ray exposure and optical image observation avoid misalignment of the measurement position of samples from becoming uneven.

Clear Optical Image Observation and Coaxial X-Ray Irradiation

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Employing of Imaging Technology Based on Raman Imaging Technique

A specific element is highlighted as a characteristic point, thus streamlining the detection of obstacles, foreign material, etc.

Employing of Imaging Technology Based on Raman Imaging Technique

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A New Solution in Foreign Material Analysis

The XGT-9000 enables foreign material to be rapidly detected via high-speed screening and highlighting by imaging processing. The high-resolution X-ray beam allows an elaborate analysis of elements constituting the foreign material. This sequence of foreign material analyses can be done with the help of a single unit, to the level of several tens of micrometers.

A New Solution in Foreign Material Analysis

Image Credit: HORIBA Scientific

Applications

Analysis of Foreign Material in Films

The XGT-9000 supports visual confirmation, detection, and analysis of even hard-to-detect foreign materials while verifying optical observation images with high resolution following elemental mapping screening.

Analysis of Foreign Material in Films

Image Credit: HORIBA Scientific

Analysis of Hydrous Samples

The XGT-9000 allows the measurement of hydrous samples and detection of foreign materials with the help of image processing.

Analysis of Hydrous Samples

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Specifications

Source: HORIBA Scientific

Model XGT-9000 XGT-9000SL
Basic information
Instrument X-ray fluorescence analytical microscope
Sample type Solids, Liquids, Particles
Detectable elements C* – Am *with optional light elements detector (F – Am with standard detector)
Available chamber size 450(W) x 500(D) x 80(H) 1030(W) x 950(D) x 500(H)
Maximum sample size 300(W) x 250(D) x 80(H) 500(W) x 500(D) x 500(H)
Maximum mass of a sample 1 kg 10 kg
Optical observation Two high-resolution cameras with an objective lens
Optical design Vertical-Coaxial X-ray and Optical observation
Sample illumination/
observation
Top, Bottom, Side illuminations/Bright and Dark fields
X-ray tube
Power 50 W
Voltage Up to 50 kV
Current Up to 1 mA
Target material Rh
X-ray optics
Number of probes Up to 4
Primary X-ray filters for
spectrum optimization
5 positions
Detectors
X-ray Fluorescence detector Silicon Drift Detector (SDD)
Transmission detector NaI(Tl)
Mapping analysis
Mapping area 100 mm x 100 mm 350 mm x 350 mm
Step size 2 mm 4 mm
Operating mode
Sample environment Full vacuum / Partial vacuum /
Ambient condition / He purged condition(Optional)
Partial vacuum / Ambient condition / He purged condition (optional)*
*He purge condition is necessary to detect down to carbon and fluorine for both detectors.

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