LabRAM Soleil Nano for Real-time and Direct Correlative Nanoscopy from Horiba is a completely combined system based on the OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano provides unparalleled abilities for photoluminescence and direct co-localized AFM-Raman measurements.
AFM imaging modes (electrical, topographic, mechanical, etc.) and Raman acquisition could be executed sequentially or concurrently at the same location of the sample surface. Optical nano-resolution is achievable with Photoluminescence (TERS/TEPL) and Tip-Enhanced Raman Spectroscopy.
LabRAM Soleil Nano is consistent with the environmental chamber for AFM and Raman measurements in a controlled atmosphere and at low temperatures.
Characteristics
Multi-Sample Analysis Platform
Macro, micro, and nanoscale measurements can be conducted on the same AFM-Raman platform.
Multi-Technique/Multi-Environment
Several SPM (scanning probe microscopy) modes, such as AFM, force curves measurements, conductive and electrical modes (KPFM, cAFM,), STM, liquid cell and electrochemical environment, collectively with chemical mapping via TERS/TEPL.
Complete control of the acquisition via one workstation and strong software control. SPM and Raman or PL microscope could be made in an independent or simultaneous manner.
Compatible with the AFM chamber available for humidity control, environmental control, and cooling sample holder.
Robustness/Stability
High resonance frequency AFM scanners. High performance is achieved without active vibration isolation.
Ease-of-Use
Completely automated operation, start quantifying within a matter of minutes.
High Collection Efficiency
Top-down and oblique Raman/PL detection are available with high numerical aperture objectives for utmost resolution and throughput in both co-localized and tip-enhanced measurements (Photoluminescence and Raman).
High Throughput Multimodal UV-VIS-NIR Achromatic Platform
Developed for Photoluminescence, Raman, Electroluminescence, and more.
Up to four internal lasers and six different filters are available; four-grating turret.
High Spatial Resolution
Nanoscale spectroscopic resolution (down to 10 nm) via Tip-Enhanced Optical Spectroscopies (TERS: Tip-Enhanced Raman Spectroscopy, and TEP: Tip-Enhanced Photoluminescence).
Super-Low Cut-Off Frequency
Down to 30 cm-1 with high throughput.
Ultrafast Raman Imaging
- SmartSampling™-100 times faster Raman maps - hours of work are converted into minutes
- 3D Raman lightsheet confocal imaging with patented Q-Scan™
Specifications
SmartSPM Scanner and Base
- Scanning type by sample: XY non-linearity 0.05 %; Z non-linearity 0.05 %
- Sample scanning range: 100 µm × 100 µm × 15 µm (±10 %)
- Noise: 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth
- X, Y, Z movement: Digital closed loop control for X, Y, Z axes; Motorized Z approach range is to around 18 mm
- Resonance frequency: XY: 7 kHz (unloaded); Z: 15 kHz (unloaded)
- Sample positioning: Tracked sample positioning range 5 × 5 mm
- Sample size: Maximum 40 × 50 mm, thickness of 15 mm
- Positioning resolution: 1 µm
AFM Head
- Registration system noise: Down to < 0.1 nm
- Alignment: Completely automated cantilever and photodiode alignment available
- Laser wavelength: 1300 nm, non-interfering with spectroscopic detector
- Probe access: Free access to the probe for additional external manipulators and probes
SPM Measuring Modes
Contact AFM in air/(liquid optional); Semicontact AFM in air/(liquid optional); Non-contact AFM; Lateral Force Microscopy (LFM); Phase imaging; Conductive AFM (optional); Force Modulation; Magnetic Force Microscopy (MFM); Capacitance and Electric Force Microscopy (EFM); Nanomanipulation; STM (optional); Volt-ampere characteristic measurements (optional); Kelvin Probe (Surface Potential Microscopy, SKM, KPFM); Force curve measurement; Piezo Response Photocurrent Mapping (optional); Force Microscopy (PFM); Nanolithography.
Spectroscopy Modes
- Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)
- Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced Photoluminescence (TEPL) in AFM, STM, and shear force modes
- Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy
Options
- Temperature control for liquid cell: Heating up to 60 °C
- Environmental chamber
- Humidity control system: Relative humidity range 10 to 85%/Relative humidity stability ±1%
- Heating module: Heating up to 300 °C/Temperature stability 0.1 °C, or heating up to 150 °C/Temperature stability 0.01 °C
- Combined Shear-force and Normal force tuning fork holder
- Signal Access Module
- Liquid Cell or Electrochemical Cell available
- Heating Cooling module: Ranges from –50 °C to + 100 °C
- STM holder available
- Conductive Unit: Current range 100 fA to 10 uA/3 current ranges (100 nA, 1 nA, and 10 µA) switchable from the software
Optical Access
- Closed loop piezo objective scanner available for ultra-stable long-term spectroscopic laser alignment: Range 20 µm × 20 µm × 15 µm; Resolution: 1 nm
- Ability to use concurrently top and side plan apochromat objective: Up to 100×, NA = 0.7 from top or side; Up to 20× and 100× concurrently
Spectrometer
- Standard wavenumber cut-off: 30 cm-1, with edge filters for 532, 638, and 785 nm wavelengths, injection rejection, >99% transmission.
- Spectrometer scanning speed: Ranges up to 400 nm/second, with 600 g/mm grating, fixed on a standard 4-grating turret.
- External lasers: Has no limit, for large gas and ultrafast lasers normally.
- Wavelength range: UV-VIS-NIR; Broadband high throughput achromatic mirror-based system, improved from 300 nm to 1600 nm without altering optics.
- Built-in lasers: Ranges up to 4 Solid-state lasers, NUV to NIR wavelengths available.
- Fast Imaging: <1 millisecond/spectrum SWIFT, SWIFT repetitive, SWIFT XS EMCCD, SWIFT eXtended Range, and SmartSampling for ultrafast imaging.
- Number of gratings: Unlimited; 4-grating exchangeable motorized turret.
Software
Combined software package, including complete featured SPM, spectrometer and data acquisition control, spectroscopic, and SPM data analysis and processing suite, such as deconvolution and filtering, spectral fitting, optional modules include univariate and multivariate analysis suite (PCA, HCA, MCR, DCA), particle detection and spectral search functionalities.