FT150 Microspot XRF Analyzers

The FT150 was designed to address the challenge of ultra-thin coatings, such as found in today’s shrinking electronic components, the FT150 produces fast, accurate and repeatable results, increasing productivity and reducing costs of inaccurate coatings on PCBs, semi-conductors and micro connectors, etc. Simple to use, the equipment integrates easily with your QA/QC process, alerting users to issues before they become a crisis.

The high throughput offered by the FT150 is possible because of the polycapillary optic and high-precision leading edge Vortex® X-ray fluorescence detector inside. A large sample table, wide opening door and substantial observation window make it easy to load items of varying size and to focus on measurement spots. Newly designed controller software enables enhanced and precise testing and results conveniently captured in a database for export.

Preview of samples and selection of measurement points is made clearer and easier thanks to the new high definition sample observation camera. Little touches, like the use of an LED light source, mean less machine maintenance and bulbs last 10 times longer.

Precision Analysis

The precision of the positioning stage and polycapillary X-ray optic mean users can measure nm-scale coatings on features smaller than 100 µm.


The new, high intensity X-ray beam, and the improved SDD detector inside the FT150, help double the instrument’s throughput compared to conventional devices.


Loading and removing samples is easy, thanks to the large door, while a big sample table accommodates components in a wide range of shapes and sizes.


The robust chassis has been designed and tested for a long life in a challenging production or laboratory environment.


A large sample observation window enables operators to view the analysis process while the door remains locked during analysis.


Measurement methods meet standards ISO 3497, ASTM B568 and DIN 50987.

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