DDCOM: Ultra-Fast Automated Crystal Orientation in a Compact Package

DDCOM

Ultra-Fast Automated Crystal Orientation in a Compact Package

Precisely ascertain the complete crystal orientation within seconds through the exclusive scanning method. DDCOM demonstrates efficiency with minimal energy consumption and operating costs, making it well-suited for applications in both research and industry.

Crystal Orientation Solutions: Ultra-Fast Crystal Orientation

Image Credit: Malvern Panalytical Ltd

Overview

Experience ultra-fast and precise crystal orientation, with accuracy up to 1/100th of a degree at your fingertips. DDCOM delivers dependable results over 100 times faster than conventional methods, further enhancing efficiency through its bottom-up measurement geometry.

This highly versatile instrument features an air-cooled X-Ray tube and a portable design, ensuring cost-effective operation and maximum convenience. It is an ideal solution for applications such as quality control, marking, and research.

Crystal Orientation Solutions: Ultra-Fast Crystal Orientation

Image Credit: Malvern Panalytical Ltd

Features and Benefits

Ultra-Fast Accuracy

The exclusive scanning technique necessitates just one rotation to collect all essential data for crystal orientation determination, yielding accurate results within 10 seconds (per single rotation).

The instrument’s material-specific geometry allows for the ultra-fast measurement of crystal lattice orientation in relation to the rotation axis, with precision scaling as the number of scan rotations increases.

Compact, User-Friendly Format

DDCOM’s compact design enables seamless integration into any environment. The software, characterized by its combination of power and user-friendly intuitiveness, ensures convenient and straightforward operation for a diverse range of users.

Precise, Efficient Control

Exercise precise control over cutting, grinding, and lapping processes with accuracy up to 1/100th of a degree. DDCOM provides comprehensive lattice orientation data for single crystals and is specifically designed for azimuthal setting and marking of crystal orientation.

Utilizing pre-programmed crystal parameters, the system facilitates the determination of orientations in diverse structures, contributing to the optimization of workflow for enhanced efficiency. Additionally, a range of accessories enables metrology at different stages of the process.

Versatile and Cost-Effective

DDCOM is adeptly suited for analysis in both research and production settings, accommodating a variety of sample types. The operational costs for DDCOM remain economical due to its low energy consumption and the utilization of an air-cooled X-Ray tube, eliminating the need for water cooling.

This instrument exhibits versatility by being capable of measuring a diverse range of materials with varying structures, making it a valuable addition to any laboratory. Examples of materials that can be measured include:

  • Cubic, arbitrary unknown orientation: Si, Ge, GaAs, GaP, InP

  • Cubic, special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, SiC3C, PbS, PbTe, SnTe, MgO, LiF, MgAl2O4, SrTiO3, LaTiO3

  • Hexagonal and trigonal: SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO3, SiO2 (quartz), Al2O3 (sapphire), GaPO4, La3Ga5SiO14

  • Tetragonal: MgF2, TiO2, SrLaAlO4

  • Orthorhombic: Mg2SiO4, NdGaO

Key Applications

Crystal Orientation Control for Cutting, Grinding, and Lapping

With its compact design, automation features, and swift measurement capabilities, DDCOM XRD provides a convenient and user-friendly solution for measuring crystal orientation. This allows for precise and efficient control of cutting, grinding, and lapping processes.

Setting and Marking of Crystal Orientation

DDCOM is designed for the azimuthal setting and marking of crystal orientation. The precision and speed required for wafer marking are crucial, and DDCOM provides the necessary swiftness and accuracy for users’ processes. Its compact-size allows for easy integration into their current setup or as part of a new process.

Quality Control

Swift measurement speed and efficient throughput are essential for production quality control, and for routine measurements, maintaining low running costs is equally important.

DDCOM excels not only in throughput and productivity, thanks to its top-down measurement geometry, but also in energy efficiency. This ensures that the costs remain low, and the processes run optimally without compromising on quality.

Materials Research

Capable of measuring a diverse array of crystal types within a compact laboratory space, DDCOM is well-suited for standard research workflows. Its operating costs are kept minimal through reduced energy consumption and the use of an air-cooled X-Ray tube, eliminating the need for water cooling.

Additionally, DDCOM is accessible and user-friendly for individuals with varying levels of experience, making it a practical solution for research laboratories.

Specifications

Source: Malvern Panalytical Ltd

Technical specification
Orientation precision <0.001°
X-Ray source 30 W air-cooled X-Ray tube, Cu anode
Detectors Two scintillation counters
Sample holder Precise turntable, setting accuracy 0.01 °, tools for defined sample positioning and marking
Physical specification
Dimensions 600 mm × 600 mm × 850 mm
Weight 80 kg
Power supply 100-230 V, 500 W, single phase
Room temperature ≤ 30 °C
Examples of measurable materials
Cubic / arbitrary unknown orientation: Si, Ge, GaAs, GaP, AlAs, AlP, InP, NaCl, AgCl, CaF2
Cubic / special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, SiC 3C, PbS, PbTe, SnTe, MgO, LiF, MgAl2O4, SrTiO3, LaTiO3
Tetragonal: MgF2, TiO2, SrLaAlO4
Hexagonal / Trigonal: SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO3, SiO2 (quartz), Al2O3 (sapphire), GaPO4, La3Ga5SiO14
Orthorhombic: Mg2SiO4, NdGaO3
Further materials according to the customers’ demands

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