The JEM-F200 "F2" Multipurpose Analytical S/TEM is the only advanced, high-throughput 200 kV S/TEM in its class to feature a Cold Field Emission Gun and dual Silicon Drift Detectors.
Incorporating JEOL’s latest innovations, the F2 offers an easy-to-use, highly stable platform for high-resolution imaging and analysis. It stands out as a versatile workhorse system with advanced capabilities that are not found in any other non-aberration corrected S/TEM.
The increased probe current from the Cold FEG, combined with dual EDS detectors, makes the F2 a top-performing analytical S/TEM. The high brightness and narrow energy spread of the next-generation JEOL Cold-FEG enable high-energy-resolution EELS for rapid chemical bonding state identification.
Dual Silicon Drift Detectors (SDDs) provide exceptional sensitivity and throughput for X-ray analysis. The new Advanced Scan System with De-Scan supports wide-field STEM-EELS spectrum imaging.
The F2’s quad lens condenser system allows independent control of beam intensity (spot size) and convergence angle, offering greater flexibility in beam shaping.
With unmatched versatility and functionality in a non-aberration corrected S/TEM, the F2 also simplifies operation. Over 100 beam conditions can be selected with a single button, and previous settings are easy to recall. ECO mode helps reduce power consumption.
A newly developed automated sample holder transfer system, the SpecPorter, streamlines sample loading. Once loaded, the PicoStage enables fast, precise sample movements in 0.5 nm steps, allowing smooth navigation across a wide spatial scale—from millimeters to picometers.
Key Features
- Advanced scan system
- Cold FEG with narrow energy spread
- Dual Silicon Drift Detectors
- Intuitive and efficient operation
- Pico stage drive for ultra-fast, high-precision movement of field-of-view
- Quad lens condenser system
- SpecPorter automated sample holder transfer system