JEOL’s innovative new Windowless EDS, Gather-X, addresses the growing demand for increased sensitivity and low-energy X-ray detection.
The new 100 mm2 windowless EDS can collect all X-rays produced by the IT800 series FE SEMs, including low-energy X-rays down to lithium. With its innovative racetrack architecture and fully integrated and interlocked controls, clear, high-count rate EDS maps with high spatial resolution can be produced by collection as close as 2 mm working distance.
Gather-X is seamlessly integrated into the existing SEM Center software with Live Analysis and is also compatible with multiple JEOL EDS detectors for enhanced versatility.
Key Features
- Detection of Characteristic X-rays less than 100 eV Down to Lithium:
- Improved detection sensitivity for distinctive X-rays below one keV and the capacity to detect soft X-ray regions below 100 eV (down to Li-K).
- Large Solid Angle:
- The large solid angle and windowless design give higher count rates, allowing for faster collection periods while reducing potential beam damage to sensitive specimens.
- Analysis at High kV - Up to 30 keV Beam:
- EDS data can be collected under typical analysis conditions without damaging the detector. The unique electron trap design allows the collection of the complete EDS range at electron beam voltages as high as 30 kV.
- Short Working Distance/Beam Deceleration Mode Analysis:
- Full integration into the new SEM Center operating system enables safe operation at short working distances for high spatial resolution and low energy settings typical of ultrahigh resolution SEMs.
- High Spatial Resolution:
- The increased sensitivity for light element detection enables a high count rate and low kV analysis. The racetrack-shaped detector enables very short working distances while maintaining a large solid angle, efficiently collecting high-resolution EDS maps.
Designed by JEOL Exclusively for JEOL SEMs
The JEOL IT810 series SEM, which includes Gather-X, is designed for unmatched simplicity of use, high sensitivity, and spatial resolution for imaging and analysis. The Gather-X operation is integrated into the SEM Center software and allows for the live (real-time) display of EDS spectra or maps while SEM imaging is performed.
This clever, adaptable, and powerful Scanning Electron Microscope system provides the greatest degree of intelligent technology for today's most versatile high-resolution, analytical FE SEM.