JEM-120i: Transmission Electron Microscope for Soft Materials

Transmission Electron Microscopes (TEMs) operating at 120 kV are commonly used in fields involving soft materials, such as biology and polymers. With this in mind, the JEM-120i was developed to ensure it was "Compact," "Easy to Use," and "Expandable."

Featuring a redesigned exterior and streamlined interface, the JEM-120i is built to be an accessible and practical tool for users of all experience levels—from daily operation to routine maintenance.

JEM-120i: Transmission Electron Microscope for Soft Materials

Image Credit: JEOL USA, Inc.

Key Features

Compact

With its significantly reduced size, the JEM-120i features a lower filament replacement position and specimen holder insertion point compared to previous models. A newly developed cartridge-style filament unit further simplifies the process, making filament replacement easy and safe for all users.

The instrument also features an LED light on its front, and its color changes depending on the state of the TEM. You can determine its operating state at a distance.

JEM-120i: Transmission Electron Microscope for Soft Materials

Image Credit: JEOL USA, Inc.

JEM-120i: Transmission Electron Microscope for Soft Materials

Image Credit: JEOL USA, Inc.

Easy to Use

Observation with the JEM-120i is streamlined into just four simple steps, from loading the specimen to completing data acquisition.

After inserting the specimen holder, a single click of the Start button automatically initiates observation setup, including voltage ramp-up and electron emission. A wide-area image is captured simultaneously, allowing users to move the stage to any desired location by simply clicking on the target field.

The built-in “Butler mode” supports data acquisition, making it easy even for beginners to capture quality data. When observation is finished, the sample holder can be exchanged without shutting down the emission, ensuring continuous and efficient operation.

Specimen Observation in 4 Steps

JEM-120i: Transmission Electron Microscope for Soft Materials

Image Credit: JEOL USA, Inc.

Seamless Observation without Switching Magnification Mode

The JEM-120i features an enhanced TEM control system and fully automated apertures, removing the need to manually switch magnification modes or select apertures. This automation streamlines the observation process, allowing for smoother and more efficient operation compared to previous models.

JEM-120i: Transmission Electron Microscope for Soft Materials

Image Credit: JEOL USA, Inc.

Expandable

The JEM-120i supports a range of retrofits. It also meets the need for additional functions after purchase.

JEM-120i: Transmission Electron Microscope for Soft Materials

Image Credit: JEOL USA, Inc.

Cryo-EM

Cryo-EM has seen a dramatic rise in popularity, driven by the development of more stable and automated electron microscopes, advanced movie-type cameras, and improved data acquisition software. The results have been remarkable, with numerous structures in EMDB and EMPIAR resolved to better than 1.5 Å resolution, such as EMD-31314, EMD-33707, and EMD-35984, the latter achieving true atomic resolution.

The JEOL JEM-120i is an excellent option for screening frozen-hydrated specimens and fits seamlessly into mixed environments alongside high-end, autonomous cryo-microscopes when used with compatible cryo-holders.

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