This fourth-generation NeoScope JCM-7000 includes modern technology and functionality, making it simple for users of all skill levels to produce excellent SEM images and elemental analysis findings in minutes.
It has a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, extremely advanced auto functions, and the ability to add a fully incorporated EDS with real-time, ‘Live’ analysis.
This 4th Generation NeoScope™ is SMART-FLEXIBLE-POWERFUL.
Smart
The benchtop platform's cutting-edge improvements make this SEM accessible to all users. Users can swiftly transition from optical images to high-resolution SEM imaging and analysis, thanks to the sample's seamless mobility. Automatic condition setup based on sample type and application delivers high-quality results while increasing productivity. Highly advanced auto functions produce images with excellent fidelity.
Flexible
Select a platform that is suitable for the user. Include features like the Stage Navigation System (color camera), fully embedded EDS for elemental analysis, and Smile View Map for 3D image reconstruction and texture analysis.
Powerful
The W filament source’s excellent resolution enables up to 100,000x magnification. Numerous sample types can be studied with a benchtop SEM equipped with high and low vacuum modes, secondary electron and backscatter electron detectors, and more. For a high-resolution image across a wider area, an automated montage is integrated. The montage X-ray map includes an EDS option. The BSE detector enables real-time 3D imaging, allowing for intuitive knowledge of sample surface form.
Live Analysis
The fully embedded EDS system from JEOL, which gives real-time EDS spectra while image observation is underway, is part of the analytical model.
Live analysis allows users to:
- Users can view EDS spectra in real time while searching for a specific area of interest
- The live image observation panel allows users to set analysis points, areas, map location, and line scan
- View all major elements as they appear on the live EDS window
Key Features
- Zeromag: Simplifies navigation and improves throughput. Ensures a smooth transition from an optical (or holder graphic) to SEM image
- Advanced Auto features enable automatic condition setting and image generation in minutes
- High resolution (100,000×) and large depth of field
- High and low vacuum modes for handling a wide range of samples
- Advanced features built-in include automated montage and live 3D imaging
- Smile View™ Lab for integrated management of image and analysis data
Neo Action – No-Code Automation for SEM Imaging and EDS Analysis
The Continuous Photo and Analysis option (MP-07260CFL) boosts productivity with streamlined, unattended operation and no programming needed.
Neo Action makes setup straightforward, letting users queue multiple measurement areas and define acquisition parameters for efficient SEM imaging and EDS analysis.
- Unattended Operation: Run analyses automatically, with no manual input required.
- No Programming Needed: Neo Action’s intuitive interface simplifies setup.
- High Throughput: Easily queue multiple areas for continuous imaging and analysis.
- Consistent Results: Apply defined acquisition settings across all samples.
- Productivity-Focused: Spend time on insights, not repetitive steps.