This benchtop ED-XRF spectrometer is an easy, smart solution for high-sensitivity elemental analysis. It examines major trace components in most sample types, including solids, powders, and liquids, with little or no sample preparation.
When SEM, EPMA, NMR, and mass spectrometry analyses are required, the ElementEye is an excellent addition.
The ElementEye is capable of 50 kV excitation and incorporates the most recent silicon drift detector (SDD) technology. Combined with JEOL’s sophisticated Fundamental Parameters (FP) approach, this instrument generates high-sensitivity qualitative and quantitative analytical findings in minutes. The Thin Film FP method is an optional non-destructive approach for measuring film thickness on coated materials.
High-sensitivity analysis can be done across the whole energy spectrum with a maximum of nine filter types and a sample chamber vacuum unit.
An optional 12-position auto sample changer accelerates analysis through continuous acquisition.
Key Features
Image Credit: JEOL USA, Inc.
- Touch screen operation
- Pre-recorded formulas for typical solution applications: RoHS, metals (air/vacuum *), oxides (air/vacuum *), organic materials (air/vacuum *)
- Short-path optical system with high-sensitivity SDD for high-throughput analysis
- Sophisticated Fundamental Parameter (FP) techniques for precise measurement without the use of standard samples
- Residual balance and thickness correction for organic samples
- It is possible to integrate and import XRF data into EPMA software
* Optionally available
Simple Operation
It is simple to use; just set the sample and touch the screen. Switching between the spectrum display and analysis findings only requires another screen tap. It is just as simple to use as a smartphone or tablet PC. (Keyboard and mouse operation is also available.)
Image Credit: JEOL USA, Inc.
High Sensitivity and High Throughput
JEOL's proprietary SDD (silicon drift detector), newly developed optical system, and filters intended to handle the whole energy spectrum enable high-sensitivity analysis. The sample chamber vacuum unit (option) improves detection sensitivity for lighter components.
Image Credit: JEOL USA, Inc.
Sensitive Analysis Throughout the Entire Energy Range
High-sensitivity analysis can be carried out over the whole energy range with a sample chamber vacuum unit and a maximum of nine different filter types.
Element correspondence with each filter and sample chamber vacuum unit. Cl, Cu, Mo and Sb are options. Image Credit: JEOL USA, Inc.
Example: trace element detection (10 ppm or less). Image Credit: JEOL USA, Inc.
Providing Solutions
Solution-based applications can automatically perform the desired analysis using pre-recorded recipes. Select the suitable solution icon from the solution application list to initiate automated analysis and display results. Solution applications enable easier analysis in a variety of disciplines.
Image Credit: JEOL USA, Inc.
The new Smart FP (Fundamental Parameter) approach allows for highly precise quantitative results without the requirement for a standard sample. It also automatically corrects for thickness and residual ingredient balance.
The residual balance adjustment and thickness correction functions are only relevant to organic samples.
Source: JEOL USA, Inc.
| Thickness |
Correction |
Cr |
Zn |
Cd |
Pb |
Automatic balance |
| 0.5 mm |
No |
0.008 |
0.037 |
0.001 |
0.002 |
99.76 |
| 3.8 mm |
0.012 |
0.109 |
0.004 |
0.006 |
99.64 |
| 0.5 mm |
Yes |
0.011 |
0.137 |
0.015 |
0.010 |
99.54 |
| 3.8 mm |
0.011 |
0.134 |
0.016 |
0.011 |
99.55 |
| Standard value |
0.010 |
0.125 |
0.014 |
0.010 |
|
Options
- Chamber Vacuum Unit
- 12-Position Auto Sample Changer
- Filter Set
- Software Solutions:
- Filter FP method
- Thin Film FP method
- Ni plating screening
- Sn plating screening
- Halogen screening
- Sum peak removal
Specifications
Source: JEOL USA, Inc.
