The JEOL IT810 Ultrahigh Resolution Field Emission SEM is a ground-breaking FE-SEM with today's most cutting-edge, high-resolution analytical technology. Combining automation, intuitive operation, and exceptional spatial resolution, the JSM-IT810 series delivers advanced analytical intelligence for high-resolution imaging and nanoscale analysis.
Smart-Flexible-Powerful
Smart - The JEOL Energy Dispersive X-ray Spectrometers (EDS), integrated into the IT810 series of Schottky Field Emission SEMs, streamline operation and enhance workflow efficiency. The system’s elegant functionality, ultrahigh resolution, and advanced automated software ensure smooth data capture, from observation to elemental analysis and reporting.
The JEOL NEOENGINE® electron beam control system and sophisticated auto features enable quick transitions between high-resolution imaging and high-current studies while retaining performance, resulting in unmatched ease of use.
Advanced algorithms improve real-time electron lens management, correct electron paths, and align the beam automatically. They also adjust focus, brightness/contrast, and astigmatism. JEOL's Live EDS analysis enables immediate monitoring of specimen chemical composition while imaging.
JEOL SEM blends optical imaging and navigation, SEM imaging, EDS Live analysis, and mapping effortlessly with a single click.
Image Credit: JEOL USA, Inc.
Flexible - The JSM-IT810 series has a large specimen chamber that simultaneously handles numerous detectors, including EDS, WDS, EBSD, STEM, BSE, and CL. JEOL’s GatherX windowless EDS detector is ideal for detecting X-rays with improved sensitivity and spatial resolution at lower energy levels (Li). JEOL’s innovative Soft X-ray Emission Spectrometer (SXES) collects very low-energy X-rays efficiently and in parallel, while delivering unmatched chemical state analysis.
Powerful - The IT810 is JEOL’s flagship FE SEM, with up to 2,000,000X magnification and an accelerating voltage range of 0.01 to 30 kV, allowing for spectacular nanostructure detail and complete analysis.
This versatile, intuitive field emission SEM pushes analytical intelligence in FE-SEM to a new level, combining ease of use with advanced performance for cutting-edge research.
Innovative No-Code Automation
The straightforward and customizable software interface makes achieving high productivity in everyday observation and analysis easy. It includes new no-code automated processes that come standard with all IT810 series microscopes.
NeoAction: New no-code automation workflows enable a beginner user to configure a sequence of images and analysis that will be done without user participation. Multiple beam and scan settings, stage locations, and detectors can all be used for imaging and analysis.
Montage: Automated imaging and analysis of large areas, including canvas stitching.
Image Credit: JEOL USA, Inc.
Key Features
- Large specimen chamber with multiple ports
- Standard montage imaging features
- Smile View Lab software for data management and report generation
- Live Analysis with integrated JEOL EDS elemental screening
- Nanostructure imaging and analysis with high spatial resolution
- Adaptable hybrid electromagnetic/electrostatic lens design with exceptional imaging and analysis performance
- NEOENGINE is an intelligent, automated electron beam control
- The system has sophisticated auto functions including focus, stigmation, and beam alignment
- In-lens field emission gun
- Aperture Angle Control Lens (ACL) for superb resolution at any kV or probe current
- Lens aberrations are lessened using the Beam Deceleration (BD) setting