The JXA-iHP200F Field Emission EPMA is a cutting-edge, premium, research-grade EPMA that offers excellent analytical and imaging resolution along with a very high and steady probe current for the best possible analytical performance.
The “SEM Center” of the FEG SEM serves as the basis for the new SEM and EDS user interface (GUI) on this microprobe. It contains new algorithms for the optical microscope's and SEM column's automatic operations.
With built-in software and graphic-driven procedures, a new GUI offers a simplified workflow called “Easy EPMA” that offers a wide range of user experiences, from complete flexibility and capabilities for the most experienced EPMA scientist to the novice or occasional user. Standard features include a stage control module and a complete knobset.
With a single click, the iHP200F's automated specimen exchange airlock and integrated color stage navigation camera on the roof enable simple access to the sample's areas of interest. Additionally, the software notifies users when regular maintenance is recommended.
Additionally, JEOL EDS and/or JEOL XRF data can be transferred straight into the EPMA software, which will choose the proper spectrometers and crystals on its own. The new standard software “Phase Map Maker” and “Phase Analysis” make use of both.
Key Features
- Enhanced total probe current available for the sample.
- Capable of executing both beam-scanned line scans and maps, as well as extensive area line scans and maps through stage scanning.
- Achieves a maximum beam current of 3 µAmps at the sample, at 30 kV, ensuring adequate beam currents at low kV for rapid, high spatial resolution microanalysis.
- Offers a flexible and customizable arrangement of spectrometers and crystals.
- The automated aperture angle control lens (ACL) minimizes the spherical aberration (Cs) of the objective lens (OL) for high-resolution analysis at elevated current and low kV.
- Features a 30 mm2 integrated and embedded UTW-SDD-EDS system with high sensitivity, including an in situ aperture wheel for ultrahigh beam current operation without compromising EDS spectrometer resolution, and “Live” survey EDS acquisition to facilitate the identification of elements of interest.
- The specimen chamber accommodates a panchromatic, high bandwidth imaging cathodoluminescence (CL) system and a fully quantitative hyperspectral CL (xCLent V System) without any loss of wavelength dispersive spectroscopy (WDS) capabilities or limitations on image collection.
- Compatible with JEOL's Soft X-Ray Emission Spectrometers (SXES, SXES-ER) for the analysis of ultralight elements and chemical states.
- Equipped with a fully dry pumped vacuum system to minimize hydrocarbon contamination.
- Integrates with Probe for EPMA (PfE).