The JXA-iSP100 with LaB6 EPMA is a cutting-edge, premium, research-grade EPMA that offers excellent analytical and imaging resolution along with a very high and steady probe current for the best possible analytical performance.
The “SEM Center” of the FEG SEM serves as the basis for the new SEM and EDS user interface (GUI) on this microprobe. It contains new algorithms for the optical microscope's and SEM column's automatic operations.
With built-in software and graphic-driven procedures, a new GUI offers a simplified workflow called “Easy EPMA” that offers a wide range of user experiences, from complete flexibility and capabilities for the most experienced EPMA scientist to the novice or occasional user. Standard features include a stage control module and a complete knobset.
With a single click, the iSP100's automated specimen exchange airlock and integrated color stage navigation camera on the roof enable simple access to the sample's areas of interest. The software also notifies users when regular maintenance is recommended.
JEOL EDS and/or JEOL XRF data can also be transferred straight into the EPMA software, which will choose the proper spectrometers and crystals on its own. “Phase Analysis” and “Phase Map Maker” are examples of new standard software that makes use of both principle component analysis and artificial intelligence (AI).
Key Features
- Spectrometer and crystal configuration that can be altered to suit the needs of the application
- Carries out large area line scans and maps using stage scanning in addition to beam-scanned line scans and maps.
- A highly sensitive 30 mm2 integrated and embedded UTW-SDD-EDS system with “Live” survey EDS acquisition to quickly locate elements of interest and an in situ aperture wheel for ultrahigh beam current operation without sacrificing EDS spectrometer resolution
- With no loss of a WDS or restrictions on image collection, the specimen chamber can support both a fully quantitative hyper-spectral CL (xCLent V System) and a panchromatic high bandwidth imaging CL.
- Facilitates the installation of the Soft X-Ray Emission Spectrometers (SXES and SXES-ER) from JEOL for the analysis of chemical states and ultralight elements.
- A completely dry pumped vacuum system to lessen the contamination caused by hydrocarbons
- Integration with the EPMA Probe (PfE)